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SIMOX SOI
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Summary data SIMOX SOI
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Thickness target and corresponding
uniformity information for 100 mm, 150 mm and 200 mm diameter wafers
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| The added thickness can
be few thousand Angstroms up to 50 + um |
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Summary:
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- Customized layer doping (degenerate to intrinsic)
- Proprietary process for minimizing defect densities
- Minimal added particles (monitored using Tencor
6220)
- Fast turnaround is standard
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