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SIMOX SOI

 

Summary data SIMOX SOI  

 

Thickness target and corresponding uniformity information for 100 mm, 150 mm and 200 mm diameter wafers

 

 
The added thickness can be few thousand Angstroms up to 50 + um
 

Summary:

  • Customized layer doping (degenerate to intrinsic)
  • Proprietary process for minimizing defect densities
  • Minimal added particles (monitored using Tencor 6220)
  • Fast turnaround is standard
 

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